Method and apparatus for triage of electronic items using magnetic field detection

ABSTRACT

An electronic circuit triage device diagnoses functionality of various electronic circuits of an electronic device. The electronic circuit triage device detects whether an electronic circuit is functioning properly by measuring a magnetic field pattern associated with the electronic circuit and comparing the magnetic field pattern to an expected magnetic field pattern.A magnetic sensor array includes non-packaged magnetic sensors disposed on a substrate. The non-packaged magnetic sensors can include bare dice, in one embodiment. In another embodiment, the magnetic sensors are formed directly on the substrate, such as by printing conductive traces on the substrate. In another embodiment, a magnetic sensor array includes a magnetic field converter configured to launch received magnetic fields along an axis corresponding to a magnetic sensor maximum sensitivity.

SUMMARY

It has been found that operation (or non-operation) of circuitry of anelectronic product can be detected by magnetic fields emitted from theproduct. For example, a cell phone exhibiting problematic operation maybe brought to a service center. The service center technician can placethe cell phone on a surface aligned to a magnetic detector array. If thebattery is discharged or charged, the magnetic field exhibits arespective pattern. If the charging circuit is operational or notoperational, the magnetic field exhibits a respective pattern. By doingtriage on a device when the device is received, the technician may moreaccurately advise the user as to repair cost and time (or if no fault isdetected, the technician may advise the user to replace an externalpower supply or cable).

According to an embodiment, a method for performing triage on anelectronic device includes receiving into a test system from aninterface a model designator for an electronic device, fetching one ormore reference magnetic field patterns corresponding to the electronicdevice, and receiving the electronic device on a test platform. Themethod includes measuring a magnetic field pattern proximate to andrelative to the electronic device, comparing the measured magnetic fieldpattern to the one or more reference magnetic field patterns, andinferring a condition of the electronic device as a function ofcorrespondence of the measured magnetic field pattern to the one or morereference magnetic field patterns. The method includes outputting theinferred condition to a user.

According to an embodiment, a system for performing triage on anelectronic apparatus includes a user interface configured to receiveinput of an electronic device model designator and output an inferredcondition of the electronic device to a user. The system includes acomputer memory configured to hold one or more reference magnetic fieldpatterns corresponding to the electronic device model. The systemincludes a test platform configured to receive and support theelectronic device. The system includes one or more magnetic sensorarrays configured to detect a magnetic field strength and direction ateach of a plurality of array locations proximate to an electronic deviceholding volume adjacent to the test platform. The system includes amicroprocessor operatively coupled to the computer memory, the userinterface, and the one or more magnetic sensor arrays. Themicroprocessor is configured to execute computer instructions tointerrogate and receive the magnetic field strengths and directions fromeach of the plurality of magnetic sensors and compare one or morereceived magnetic field patterns corresponding to the received magneticfield strengths and directions to the one or more reference magneticfield patterns corresponding to the electronic device model. Themicroprocessor is configured to execute computer instructions to infer acondition of the electronic device by selecting a best fit between theone or more received magnetic field patterns and the one or morereference magnetic field patterns and output the inferred condition tothe user via the user interface.

According to an embodiment, a method includes receiving an electronicdevice on a test platform of an electronic circuit triage system,measuring a magnetic field pattern from the electronic device, andcomparing the measured magnetic field pattern to one or more referencemagnetic field patterns. The method includes determining a condition ofthe electronic device based on the comparison of the measured magneticfield pattern to the one or more reference magnetic field patterns, andoutputting an indication of the condition to a user.

According to an embodiment, an electronic triage system includes a testplatform configured to receive an electronic device, and one or morearrays of magnetic sensors collectively positioned configured to sensemagnetic field characteristics indicative of a magnetic field patternfrom the electronic device when the electronic device is positioned onthe test platform. The electronic triage system includes amicroprocessor coupled to the magnetic sensor and configured to comparethe magnetic field pattern to one or more reference magnetic fieldpatterns and to diagnose a condition of the electronic device based oncomparison of the magnetic field pattern to the one or more referencemagnetic field patterns.

According to an embodiment, a magnetic sensor or magnetometer arrayincludes a substrate, a sensor array interface disposed on thesubstrate, a plurality of sensors disposed on the substrate, and asensor interface circuit disposed on the substrate and configured tooperatively couple the plurality of magnetic sensors to the sensor arrayinterface.

According to an embodiment, a magnetic sensor array includes a pluralityof magnetic field sensors disposed on a substrate and configured todetect magnetic field components parallel to the substrate. According toan embodiment, a magnetic field converter guides a magnetic fieldcomponent along its surface to cause a magnetic field component normalto the substrate to be detected by a magnetic field sensor configured todetect magnetic field components parallel to the substrate.

According to an embodiment, a magnetic sensor array includes a pluralityof magnetic field sensors disposed on a substrate and configured todetect magnetic field components normal to the substrate. According toan embodiment, a magnetic field converter guides a magnetic fieldcomponent along its surface to cause a magnetic field component parallelto the substrate to be detected by a magnetic field sensor configured todetect magnetic field components normal to the substrate.

According to an embodiment, a magnetic sensor array includes a pluralityof unpackaged magnetic field sensor devices disposed on a substrate. Inan embodiment, the plurality of unpackaged magnetic field sensor devicesinclude respective subsets configured to sense a magnetic fieldcomponent along an x-axis parallel to the substrate, a magnetic fieldcomponent along a y-axis parallel to the substrate, and a magnetic fieldcomponent along a z-axis normal to the substrate.

According to an embodiment, a magnetic sensor array includes a pluralityof unpackaged magnetic field sensor devices disposed on a substrate, themagnetic sensor array including a subset configured to detect a magneticfield component along an x-axis parallel to the substrate and anothersubset configured to detect a magnetic field component along a y-axisperpendicular to the x-axis and parallel to the substrate. According toan embodiment, the magnetic sensor array is operatively coupled to amagnetic field converter configured to cause a portion of the x-axismagnetic field sensors to detect magnetic field components from both thex-axis and from the z-axis normal to the substrate. According to anembodiment, the magnetic sensor array is operatively coupled to amagnetic field converter configured to cause a portion of the y-axismagnetic field sensors to detect magnetic field components from both they-axis and from the z-axis.

According to an embodiment, a magnetic field sensor system includes asignal processor operatively coupled to each of the magnetic fieldsensors. The signal processor is configured to extract from sensoroutput sensed magnetic field components corresponding to z-axis fromsensed magnetic field components corresponding to the x- and y-axes.

According to an embodiment, a magnetic sensor array includes a pluralityof magnetic sensors formed on a substrate. In one embodiment, themagnetic sensors are formed from a conductive thick film paste depositedand cured on the substrate. For example, the conductive thick film pastecan be screen printed or pad printed.

In an embodiment, a magnetic sensor array can be formed on a flexiblesubstrate. In an embodiment, a magnetic sensor array can be formed on acurved substrate.

According to an embodiment, a method for operating a magnetic sensorarray includes, for each of a plurality of magnetometers in a magneticsensor array, receiving a magnetic field having a magnetic fieldcomponent along a first axis, guiding the magnetic field component witha magnetic field converter from the first axis to a second axis,receiving the magnetic field along the second axis with themagnetometer, and outputting a signal or data proportional to thereceived magnetic field strength along the second axis from themagnetometer through a sensor interface circuit to a sensor arrayinterface. The method can further include receiving a plurality of dataor signals corresponding to the plurality of magnetometers from thesensor array interface into a magnetic pattern analysis circuit andgenerating an image of a magnetic field pattern corresponding to thereceived magnetic field at each of a plurality of magnetometer locationsin the magnetic sensor array.

According to an embodiment, a method for making a magnetic sensor arrayincludes providing a substrate including a sensor interface circuit,affixing a plurality of magnetometers at respective predeterminedlocations to the substrate, electrically coupling each of themagnetometers to the sensor interface circuit, and coupling a sensorarray interface to the sensor interface circuit. The plurality ofmagnetometers can be unpackaged magnetometers.

According to an embodiment, an electronic device test system includes amagnetometer array including a plurality of magnetometers aligned toreceive an instantaneous magnetic field pattern from an electronicdevice in a magnetic field measurement region, and a test circuitconfigured to receive signals or data from the magnetometer array and tooutput, to an analysis device, magnetic field data corresponding to thereceived signals or data. The analysis device includes a computerapplication configured to diagnose one or more hardware defects in theelectronic device as a function of the magnetic field data.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an illustration of an electronic circuit triage system,according to an embodiment.

FIG. 2 is an illustration of a magnetic field pattern image, accordingto an embodiment.

FIG. 3 is a testing control object of an electronic device, according toan embodiment.

FIG. 4 is an illustration of a user interface of an electronic circuittriage system, according to an embodiment.

FIG. 5 is an illustration of a magnetic field pattern image, accordingto an embodiment.

FIG. 6 is an illustration of a magnetic field pattern image, accordingto an embodiment.

FIG. 7 is a block diagram of an electronic circuit triage system,according to an embodiment.

FIG. 8 is a flow diagram of a method for performing triage on anelectronic device, according to an embodiment.

FIG. 9 is a flow diagram of a method, according to an embodiment.

FIG. 10 is a view of a magnetic sensor array, according to anembodiment.

FIG. 11 is a partial view of a magnetic sensor array, according to anembodiment.

FIG. 12 is a partial view of a magnetic sensor array, according to anembodiment.

FIG. 13 is a sectional view of a magnetic sensor array, according to anembodiment.

FIG. 14 is a partial top view of a magnetic sensor array, according toan embodiment.

FIG. 15 is a perspective view of a portion of the magnetic sensor arrayof FIG. 14, according to an embodiment.

FIG. 16 is a detail view of an illustrative sensor in the magneticsensor array of FIG. 14 and a portion of a magnetic field converterconfigured to guide a magnetic field component received normal to asubstrate surface to an axis parallel to the substrate surface,according to an embodiment.

FIG. 17 is a block diagram of a magnetic sensing system, according to anembodiment.

FIG. 18 is a detail view of an illustrative sensor in a magnetic sensorarray and a portion of a magnetic field converter configured to guide amagnetic field component received parallel to a substrate surface to anaxis normal to the substrate surface, according to an embodiment.

FIG. 19 is a plan (top) view of a magnetic sensor system including aplurality of z-axis magnetic field sensors formed directly on asubstrate, according to an embodiment.

FIG. 20 is a flow chart showing a method for operating a magnetic sensorarray, according to an embodiment.

FIG. 21 is a flow chart showing a method for making a magnetic sensorarray, according to an embodiment.

FIG. 22 is a block diagram of an electronic device test system,according to an embodiment.

DETAILED DESCRIPTION

In the following detailed description, reference is made to theaccompanying drawings, which form a part hereof. In the drawings,similar symbols typically identify similar components, unless contextdictates otherwise. The illustrative embodiments described in thedetailed description, drawings, and claims are not meant to be limiting.Other embodiments may be utilized, and other changes may be made,without departing from the spirit or scope of the subject matterpresented here.

FIG. 1 is an illustration of an electronic circuit triage system 102,according to an embodiment. The electronic circuit triage system 102 isconfigured to perform triage on an electronic device 104. In particular,the electronic circuit triage system 102 is configured to analyze anelectromagnetic field generated by electronic circuits or circuit blocksof the electronic device 104 in order to ascertain how each electroniccircuit or circuit block of the electronic device 104 is functioning. Inthis way, the electronic circuit triage system 102 can determine which,if any, electronic circuits or circuit blocks of the electronic device104 is not functioning properly.

According to an embodiment, the electronic circuit triage system 102operates on the principle that, in many cases, an electronic circuitgenerates an electromagnetic field that is typical of the electroniccircuit. This electromagnetic field can be used as a type of“fingerprint” of that particular electronic circuit. The electroniccircuit triage system 102 can measure the electromagnetic fields of thevarious electronic circuits or circuit blocks of the electronic device104 and can detect whether or not the electromagnetic fields of theelectronic circuits align with the expected electromagnetic fields ofthe electronic circuits. If the electromagnetic field of a particularelectronic circuit is different than the expected electromagnetic fieldgenerated by that electronic circuit, then the electronic circuit triagesystem 102 determines that the electronic circuit is not functioningcorrectly. In this way, the electronic circuit triage system 102captures the electromagnetic fingerprint and uses 3-D image analysis todetermine whether the electromagnetic fingerprint corresponds to acorrectly functioning circuit.

According to an embodiment, the electronic circuit triage system 102utilizes an array of magnetic sensors in order to measure, for eachelectronic circuit of the electronic device 104, the magnetic fieldpattern generated by that electronic circuit. The electronic device 104can be placed on a designated sensing area of the electronic circuittriage system 102. The magnetic sensors can be positioned to detectmagnetic fields generated by the electronic device 104 while theelectronic device 104 is positioned on the designated sensing area.

In one embodiment, the designated sensing area can be on a tray 105 ofthe electronic circuit triage system 102. The electronic device 104 canbe placed on the tray 105. The tray 105 can include an array of magneticsensors therein, for example below a top surface of the tray 105. Whenthe electronic device 104 is placed in the tray 105, the magneticsensors of the electronic circuit triage system 102 are in a positionrelative to the electronic device 104 to measure the magnetic fieldgenerated by the electronic circuit of the electronic device 104.

In one embodiment, the designated sensing area is in an interior area ofthe electronic device 104, such as within a slot 103. The electronicdevice 104 can be positioned on the tray 105 and then slid into the slot103. The magnetic sensors are positioned to detect the magnetic fieldsgenerated by the electronic device 104 when the electronic device 104 ispositioned within the slot 103. When the electronic device 104 is placedin the slot 103, the magnetic sensors of the electronic circuit triagesystem 102 are in a position relative to the electronic device 104 tomeasure the magnetic field generated by an electronic circuit of theelectronic device 104.

In one embodiment, the array of magnetic sensors can include respectivesensors for measuring magnetic fields in each of 3 mutually orthogonaldimensions. These dimensions can be designated X, Y, and Z dimensions.Alternatively, the magnetic sensors can include respective sensors formeasuring magnetic fields in fewer than 3 dimensions.

In one embodiment, each magnetic sensor can include an inductor coilaligned to detect a magnetic field component in a respective directionsuch as the X, Y, or Z direction. The magnetic sensors can include MEMSmagnetic sensors, magnetoresistive sensors, hall effect sensors, pulsedfield extraction magnetometers, torque magnetometers, faraday forcemagnetometers, optical magnetometers, or other types of magneticsensors.

According to an embodiment, the electronic circuit triage system 102 isconfigured to perform triage on each of a plurality of electroniccircuits of the electronic device 104, in sequence. In an example inwhich the electronic device 104 is a mobile phone, the electroniccircuit triage system 102 can measure the magnetic field of each of theplurality of electronic circuits including a flash memory array, adisplay, an applications processor, a dynamic random access memory(DRAM), a baseband radio processor, power and wire, a touch controller,a global positioning system (GPS), an image sensor, a power monitorcircuit (PMC), or other electronic circuits or circuit blocks of themobile phone. The electronic circuit triage system 102 can test each ofthese electronic circuits in sequence and can provide diagnosis of thefunctionality of each of these electronic circuits based on whether ornot their respective magnetic fields align with expected magneticfields.

According to an embodiment, the electronic circuit triage system 102 isconfigured to perform triage for one or more of mobile phones, tablets,laptops, medical devices, aviation circuitry, automobile circuitry, orother kinds of electronic devices 104 and electronic circuitry. In somecases, the electronic circuit triage system 102 can be brought to alocation of electronic devices 104 that are not easily moved in order totest the electronic devices 104. In other cases, the electronic devices104 can be brought to the electronic circuit triage system 102 in orderto receive triage services from the electronic circuit triage system102. Thus, the electronic circuit triage system 102, in accordance withprinciples of the present disclosure, can be utilized in a large varietyof ways to measure a large variety of electronic devices 104.

FIG. 2 is an illustration of a magnetic field pattern image 200,according to an embodiment. The magnetic field pattern image 200indicates the magnitude of the vector in the X, Y, Z dimensions of themagnetic field generated by an electronic circuit of the electronicdevice 104. The magnetic field pattern image 200 indicates that themagnetic sensors of the electronic circuit triage system 102 include anarray of three sensors spaced along the X-axis and three sensors spacedon the Y-axis. When the electronic device 104 is positioned in thedesignated sensing area of the electronic circuit triage system 102, thesensors are able to sense the magnetic field generated by whicheverelectronic circuit of the electronic device 104 currently under test.The electronic circuit triage system 102 can then generate the 3-Dmagnetic field pattern image 200 representing the profile of themagnetic field generated by the electronic circuit of the electronicdevice 104.

Those of skill in the art will recognize, in light of the presentdisclosure, that other arrays and combinations of magnetic sensors canbe utilized to measure the magnetic field pattern of an electroniccircuit. A magnetic field pattern could indicate the strength of themagnetic field in multiple axes, for example 2 or more of the X, Y, andZ axes. The electronic circuit triage system 102 can include other kindsof sensors, including electric field sensors in order to generate anelectromagnetic field pattern for triage purposes. All such othercombinations of sensors and types of electromagnetic profile images fallwithin the scope of the present disclosure.

FIG. 3 is a testing control object 300 of an electronic device 104. Inthe example of FIG. 3, the testing control object 300 is of a mobilephone. The testing control object 300 can be displayed by the electroniccircuit triage system 102 in order to allow a user or technician toselect which electronic circuit or circuit blocks of the mobile phoneshould be tested. The testing control object 300 can be displayed on adisplay of the electronic circuit triage system 102 as part of agraphical user interface. The technician or user can select, fortesting, an electronic circuit or component of the electronic device 104by selecting the corresponding block on the testing control object 300via the graphical user interface.

Today's mobile phones have modules or components. Each module representsa complex circuit designed to perform a separate function. Theelectronic circuit triage system 102 recognizes the electromagneticfields created by each module. The electronic circuit triage system 102can rapidly distinguish when modules are not operating properly,regardless of whether or not the display is working.

According to an embodiment, the user or technician can select one ormore of the electronic circuits, such as the NAND Flash, the display,the applications processor, the DRAM, the baseband processor, theradiofrequency (RF) and the front end module (FEM) circuitry, the poweramplifier, the power management integrated circuit (PMIC), thecombo-chip, the touch controller, the GPS, or the image sensors. Each ofthese modules can have a separate price for testing the module. If acustomer brings a mobile phone to be tested, the electronic circuittriage system 102 can display the testing control object 300 and allowthe user to select which electronic circuits, circuit blocks, or modulesof the mobile phone should be tested. The price can correspond to theelectronic circuits selected by the user. The electronic circuit triagesystem 102 can then proceed to test the selected circuits.

According to an embodiment, the electronic circuit triage device 102 canreceive electromagnetic signals from the mobile phone and can comparethe electromagnetic signals to electromagnetic signals corresponding toknown failure modes in order to determine the functionality of each ofthe modules selected for testing.

According to an embodiment, the mobile phone, or other electronic device104 to be tested, can include a companion software application that canbe activated to initiate a diagnostic mode to assist the electroniccircuit triage system 102 to test the various circuits or modules. Thecompanion software application can be initiated through specifichardware button press combinations. Once the companion softwareapplication has been initiated, the companion software application cancause the mobile phone to generate a unique electromagnetic signalindicating to the electronic circuit triage system 102 that the mobilephone is active. The companion software application can activateseparate circuits or modules of the mobile phone to assist in thediagnostic process performed by the electronic circuit triage system102. The companion software application can activate the separatecircuits or modules responsive to manipulation of hardware buttons orother hardware controls of the mobile phone. In particular, thecompanion software application can activate the separate circuits ormodules responsive to combinations of hardware button presses.Additionally or alternatively, the companion software application canactivate the separate circuits or modules responsive to signals receivedfrom the electronic circuit triage system 102. Additionally oralternatively, the companion software application can activate theseparate circuits or modules in an order set forth by the companionsoftware application. The companion software application can be utilizedby electronic devices 104 other than mobile phones.

FIG. 4 is an illustration of a user interface 400 of an electroniccircuit triage system 102, according to an embodiment. The userinterface 400 allows the user or technician to select one of a largevariety of mobile phone models to be tested. The electronic circuittriage system 102 includes the capability to test the electroniccircuits of each of the mobile phones that can be selected through theuser interface 400. The electronic circuit triage system 102 can includein its internal memory data related to the electromagnetic fieldpatterns expected for each of the electronic circuits of the variousmodels of mobile phones. The user can select the correct model of mobilephone and insert the mobile phone into the test platform of theelectronic circuit triage system 102. The electronic circuit triagesystem 102 can then test one or more of the electronic circuits of themobile phone.

In one example, a customer's mobile phone is blank and appearsunresponsive. The customer, or a technician, can place the mobile phonein the designated receiving area of the electronic circuit triage system102. The customer or the technician can select various tests to beperformed. The electronic circuit triage system 102 may first test thebattery, to determine whether or not the battery carries a charge. Ifthe battery carries a charge, it will have a certain kind ofelectromagnetic field. A battery that does not carry a charge will havea different kind of electromagnetic field. The electronic circuit triagesystem 102 may then test charging circuitry of the mobile phone while acharging cable is attached and may test whether the charging circuitryis active, and if the charging circuitry is active, whether or not thecharging circuitry is behaving normally. The electronic circuit triagesystem 102 may then do a power on test and determine whether the poweron sequence is normal when the power on button is pressed. Next, theelectronic circuit triage system 102 can perform baseband tests anddetermine whether the cellular radio is on, and if so, whether theresponse is normal. The baseband tests can include testing whether theWi-Fi is on and whether the Wi-Fi response is normal. The baseband testscan include whether the Bluetooth is on and whether the Bluetoothresponse is normal. Based on these baseband tests, the electroniccircuit triage system 102 can determine whether or not these electroniccircuits of the mobile phone are functioning properly. The diagnosisfrom these tests can determine whether the mobile phone should beshipped to a manufacturer for repair, whether the mobile phone can berepaired at a local repair shop, whether installing a new battery orpurchasing new charging cables will fix an issue, or whether other kindsof action should be taken. This can save the customers and themanufacturers time and money.

FIG. 5 is an illustration of a magnetic field pattern image 500,according to an embodiment. The magnetic field pattern image 500 wascaptured from a particular mobile phone with the Bluetooth and the Wi-Ficircuits on, while the screen and the cellular circuits were off. Themagnetic field pattern image 500 indicates the magnitude of the magneticfield vector in the X, Y, Z dimensions generated by an electroniccircuit of the electronic device 104.

FIG. 6 is an illustration of a magnetic field pattern image 600,according to an embodiment. The magnetic field pattern image 600indicates the magnetic field vector in the X, Y, Z dimensions generatedby an electronic circuit of the electronic device 104.

FIG. 7 is a block diagram of an electronic circuit triage system 102,according to an embodiment. The electronic circuit triage system 102 isconfigured to perform triage on an electronic device 104 in order todiagnose a condition of one or more electronic circuits within theelectronic device 104.

According to an embodiment, the electronic circuit triage system 102includes a test platform 705, an array of magnetic sensors 706, aprocessor 708, a memory 710, and a user interface 712. The electroniccircuit triage system 102 utilizes these components in order to performtriage on the electronic device 104. In particular, the electroniccircuit triage system 102 is configured to enable a user or a technicianto operate the electronic circuit triage system 102 in order to performtriage on the electronic device 104 and to receive information from theelectronic circuit triage system 102 indicating a state of operabilityof one or more electronic circuits of the electronic device 104.

According to an embodiment, the electronic circuit triage system 102includes the test platform 705. The test platform 705 is an areaconfigured to receive the electronic device 104 in order to performtriage on the electronic device 104. The test platform 705 can includeone or more of a tray on which the electronic device 104 can be placed,a slot in which the electronic device 104 can be placed, an interiorvolume of the electronic circuit triage system 102 in which theelectronic device 104 can be placed, a pad, receiving grooves, a stand,a niche, or any other suitable receiving area at which the electronicdevice 104, or a portion of the electronic device 104, can be placed.The test platform 705 can be sized to accommodate a large variety ofelectronic devices 104. Alternatively, the test platform 705 can besized to accommodate a certain type and general size of the electronicdevice 104.

According to an embodiment, the electronic circuit triage system 102 caninclude a housing that is magnetically shielded from externalelectromagnetic signals or interference. This shielding can inhibitexternal electromagnetic signals from interfering with the diagnosticprocesses being performed on the electronic device 104 positioned on orin the test platform 705. This can result in a more accurate diagnosticprocess. Alternatively or additionally, the electronic circuit triagesystem 102 can include other types of shielding to inhibit the externalelectromagnetic signals from interfering with the diagnostic processes.In an embodiment, the test platform 705 is positioned within magneticshielding (formed as part of or disposed within the housing) including ahigh magnetic permeability material selected to form a low reluctancepath around the test platform 705, the electronic device 104, and thearray of magnetic sensors 706 for low frequency or static externalmagnetic fields. For example, the high magnetic permeability materialmay include mu-metal.

According to an embodiment, the electronic circuit triage system 102utilizes the array of magnetic sensors 706 in order to diagnose whetherone or more of the electronic circuits of the electronic device 104 arefunctioning properly. The array of magnetic sensors 706 are positionedso that when the electronic device 104 is placed in the designatedreceiving area, such as on the test platform 705, the array of magneticsensors 706 can sense the parameters of a magnetic field generated bythe electronic device 104. The parameters of the magnetic fieldgenerated by the electronic device 104 can indicate a functional stateof one or more of the electronic circuits of the electronic device 104.The array of magnetic sensors 706 generate sensor signals that indicatethe parameters of the magnetic field generated by the electronic device104. A magnetic field pattern can be generated or derived based on thesensor signals. The magnetic field pattern can provide an indication ofthe functionality of one or more of the electronic circuits of theelectronic device 104.

According to an embodiment, the memory 710 stores data related to thefunctionality of the electronic circuit triage system 102. The data caninclude software instructions for executing the various functions of theelectronic circuit triage system 102. The memory 710 can also storemagnetic field reference data. The magnetic field reference data caninclude data related to a plurality of reference magnetic fieldpatterns. The reference magnetic field patterns correspond to knownmagnetic field patterns for states of operability of various electroniccircuits of a large number of electronic devices 104.

According to an embodiment, the electronic circuit triage system 102 canbe configured to perform triage on various models of mobile phones. Eachmodel of mobile phone may have several electronic circuits, or circuitblocks, whose functionality can be tested. The memory 710 storesreference magnetic field patterns for each electronic circuit or circuitblock of each model of mobile phone. The memory 710 can store multiplereference magnetic field patterns for each electronic circuit or circuitblock. The multiple reference magnetic field patterns for eachelectronic circuit or circuit block correspond to various states ofoperability of the electronic circuit or circuit block. For example, fora given electronic circuit or circuit block, the memory 710 can storethe reference magnetic fields corresponding to a state in which theelectronic circuit or circuit block is properly functioning and a statein which the electronic circuit or circuit block is not properlyfunctioning.

According to an embodiment, the processor 708 is configured to analyzethe magnetic field patterns generated by the electronic device 104 andcompare them to the reference magnetic field patterns stored in thememory 710 in order to determine whether or not the various electroniccircuits of the electronic device 104 are functioning properly. When anelectronic circuit of the electronic device 104 is being tested, thearray of magnetic sensors 706 sense the parameters of the magnetic fieldgenerated by the electronic circuits of the electronic device 104 andgenerate sensor signals indicating the parameters of the magnetic field.The processor 708 receive the sensor signals and generates from thesensor signals a magnetic field pattern that represents the magneticfield generated by the electronic device 104. The processor 708 thencompares the magnetic field pattern to one or more of the referencemagnetic field patterns stored in the memory 710 in order to determinethe operability of the electronic circuit of the electronic device 104.The processor 708 is able to determine if the electronic circuit isfunctioning properly based on how the magnetic field pattern compares toone or more of the reference magnetic field patterns associated with theparticular electronic circuit of the electronic device 104. Theprocessor 708 can generate output data that indicates the operability ofthe particular electronic circuit of the electronic device 104 that iscurrently being tested.

According to an embodiment, the electronic circuit triage system 102utilizes the user interface 712 in order to provide an indication ofwhether the electronic circuit that is currently being tested isfunctioning properly. The user interface 712 can provide this indicationto a user of the electronic circuit triage system 102, a technicianoperating the electronic circuit triage system 102, or to a separatesystem. The user interface 712 can include a display such as an LCDscreen that can display text or images indicating results of the currenttest. The user interface 712 can include one or more LEDs that canprovide an indication of the results of the current test, the currentstate of operation of the electronic circuit triage system 102, or otherinformation. The user interface 712 can include one or more speakersthat can output audio information related to the state of the electroniccircuit triage system 102. The user interface 712 can include one ormore wireless transmitters configured to output a wireless signalcarrying information to another electronic device 104 regardingoperations being performed by the electronic circuit triage system 102.The user interface 712 can include one or more ports for making wiredconnections with other electronic devices 104. The electronic circuittriage system 102 can transmit data over the wired connections relatedto the operations being performed by the electronic circuit triagesystem 102. The electronic circuit triage system 102 can include othertypes of user interfaces 712 for outputting data and information topersonnel or systems.

According to an embodiment, the user interface 712 can include aninterface for receiving input from users, technicians, or otherelectronic systems. The user interface 712 can include touchscreens,touchpads, number pads, keypads, buttons, switches, or other devices bywhich users can input data and instructions to the electronic circuittriage system 102. The instructions can include selecting a particularmodel of electronic device 104 for testing. The instructions can includeselecting a particular electronic circuit or circuit block of theelectronic device 104 for testing.

According to an embodiment, the processor 708 controls the functionalityof the various components of the electronic circuit triage system 102.The processor 708 can be connected to the user interface 712 and canreceive instructions, data, or commands via the user interface 712. Inresponse to the instructions, the data, or the commands received fromthe user interface 712, the processor 708 can activate the array ofmagnetic sensors 706 in order to sense the magnetic field from theelectronic device 104 in accordance with performing triage on theelectronic device 104. The processor 708 can control the memory 710 inorder to retrieve the one or more reference magnetic field patterns fromthe memory 710. The processor 708 can generate a magnetic field patternfrom sensor signals received from the array of magnetic sensors 706. Theprocessor 708 can compare the magnetic field pattern to the one or morereference magnetic field patterns retrieved from the memory 710. Theprocessor 708 can cause the user interface 712 to output the results soother users, technicians, or electronic systems can be aware of theresults of the analysis of the electronic device 104.

According to an embodiment, the user interface 712 includes a displaythat displays the magnetic field patterns generated by the processor708. A user or a technician can view the magnetic field patterns and candetermine whether various circuits of the electronic device 104 arefunctioning properly. According to an embodiment, the display may showboth the magnetic field pattern generated from a current test of anelectronic circuit and a reference magnetic field pattern that indicateshow the magnetic field for that electronic circuit is expected to be.The technician can then analyze the displayed magnetic field patternimages and determine whether or not the electronic circuit isfunctioning properly.

Those of skill in the art will recognize, in light of the presentdisclosure, that the electronic circuit triage system 102 can includecomponents, functional blocks, and hardware, functional blocks inhardware other than those shown in FIG. 1 and described herein. Forexample, some of these components may not be discrete components, butmay instead be combined together or may be part of other components.Some components may include additional hardware or functionality. Somecomponents may perform functions ascribed to other components in thedescription herein. All such other components and configurations ofcomponents fall within the scope of the present disclosure.

According to an embodiment, the array of magnetic sensors 706 generatessensor signals that provide an indication of the various components ofthe magnetic field at various locations. For example, the array ofmagnetic sensors 706 can generate sensor signals that indicate thestrength of the magnetic field at various locations in one or more ofthree dimensions. These dimensions can correspond to mutually orthogonalX, Y, and Z axes. According to an embodiment, some or all of the arrayof magnetic sensors 706 can move during a testing operation in order tomeasure the various components of the magnetic field generated by theelectronic device 104 at various locations. According to an embodiment,the array of magnetic sensors 706 includes multiple magnetic sensors 706for each component of the magnetic field. For example, the electroniccircuit triage system 102 can include multiple magnetic sensors 706 forsensing an X component of the magnetic field at various locations,multiple magnetic sensors 706 for sensing a Y component of the magneticfield at various locations, and multiple magnetic sensors 706 forsensing a Z component of the magnetic field at various locations.According to an embodiment, an individual magnetic sensor 706 can sensemultiple components of the magnetic field generated by the electronicdevice 104. According to an embodiment, the outputs of various magneticsensors 706 together indicate the various components of the magneticfield generated by the electronic device 104. According to anembodiment, the electronic circuit triage system 102 is configured tomove the electronic device 104 relative to the magnetic sensors 706 inorder to sense the magnetic field at various locations.

According to an embodiment, the processor 708 generates, from the sensorsignals provided by the magnetic sensors 706, a magnetic field pattern.The magnetic field patterns can correspond to a 3-D image. The processor708 can utilize 3-D image analysis to compare the magnetic field patternto one or more reference magnetic field patterns in order to determinewhether the electronic circuit of the electronic device 104 isfunctioning properly.

FIG. 8 is a flow diagram of a method 800 for performing triage on anelectronic device, according to an embodiment. At 802, a modeldesignator is received into a test system from an interface for anelectronic device. At 804, one or more reference magnetic field patternsare fetched corresponding to the electronic device. At 806, theelectronic device is received on a test platform. At 808, a magneticfield pattern is measured proximate to and relative to the electronicdevice. At 810, the measured magnetic field pattern is compared to theone or more reference magnetic field patterns. At 812, a condition ofthe electronic device is inferred as a function of correspondence of themeasured magnetic field pattern to the one or more reference magneticfield patterns. At 814, the inferred condition is output to the user.

According to an embodiment, the one or more reference magnetic fieldpatterns includes a plurality of reference magnetic field patterns.

According to an embodiment, each reference magnetic field patterncorresponds to a nominal condition, a condition requiring repair, acondition corresponding to disablement of an electronic devicesubsystem, a condition requiring battery charging, or a conditionindicating battery degradation.

According to an embodiment, the method can further include capturing animage of the electronic device and determining an orientation andlocation of the electronic device relative to the test platform.Comparing the measured magnetic field pattern to the one or morereference magnetic field patterns can compensate for the orientation andlocation of the electronic device relative to the test platform.

According to an embodiment, the method further includes transmitting asignal to the electronic device to attempt to cause the electronicdevice to enter one or more activated states. According to anembodiment, measuring the magnetic field pattern proximate to andrelative to the electronic device includes measuring the magnetic fieldpattern while the electronic device is in each of the one or moreactivated states.

FIG. 9 is a flow diagram of a method 900, according to an embodiment.The method 900 includes, in step 902, receiving an electronic device ona test platform of an electronic circuit triage system. In step 904, themethod 900 includes measuring a magnetic field pattern from theelectronic device. In step 906, the method 900 includes comparing themeasured magnetic field pattern to one or more reference magnetic fieldpatterns. In step 908, the method 900 includes determining a conditionof the electronic device based on the comparison of the measuredmagnetic field pattern to the one or more reference magnetic fieldpatterns. In step 910, the method 900 includes outputting an indicationof the condition to a user.

According to an embodiment, the method 900 further includes receiving,into the electronic circuit triage system, a model designation for theelectronic device, and fetching the one or more reference magnetic fieldpatterns in accordance with the model designation. In one embodiment,the model designation identifies a make or model of the electronicdevice. The electronic device may be a mobile phone. In anotherembodiment, the one or more reference magnetic field patterns include aplurality of reference magnetic field patterns.

According to an embodiment, each reference magnetic field patterncorresponds to a nominal condition, a condition requiring repair, acondition corresponding to disablement of an electronic devicesubsystem, a condition requiring battery charging, or a conditionindicating battery degradation.

According to an embodiment, the method 900 further includes capturingone or more reference images of the electronic device, and determiningan orientation and a location of the electronic device relative to thetest platform. Comparing the measured magnetic field pattern to the oneor more reference magnetic field patterns can include compensating forthe orientation and the location of the electronic device relative tothe test platform.

According to an embodiment, the method 900 further includes transmittinga signal to the electronic device to attempt to cause the electronicdevice to enter one or more activated states. Measuring the magneticfield pattern from the electronic device can include measuring themagnetic field pattern while the electronic device is in each of the oneor more activated states.

According to an embodiment, the method 900 further includes receiving aselection of a component of the electronic device for testing, whereinthe one or more reference images correspond to the selected component.In one embodiment, the selected component includes one or more of: abattery of the electronic device, a battery charging circuit of theelectronic device, a memory of the electronic device, a display of theelectronic device, and a power management system of the electronicdevice.

According to an embodiment, outputting the indication of the conditionto the user includes displaying the indication on the display of theelectronic circuit triage system.

According to an embodiment, an electronic circuit triage system includesa test platform configured to receive an electronic device, and one ormore arrays of magnetic sensors collectively positioned and configuredto sense magnetic field characteristics indicative of a magnetic fieldpattern from the electronic device when the electronic device ispositioned on the test platform. The electronic circuit triage systemalso includes a microprocessor coupled to the magnetic sensor andconfigured to compare the magnetic field pattern to one or morereference magnetic field patterns and to diagnose a condition of theelectronic device based on a comparison of the magnetic field pattern tothe one or more reference magnetic field patterns.

According to an embodiment, the electronic circuit triage system furtherincludes a memory configured to store the one or more reference magneticfield patterns. The microprocessor may be configured to access the oneor more reference magnetic field patterns from the memory.

According to an embodiment, the electronic circuit triage system furtherincludes a user interface configured to receive a model designationindicating a model of the electronic device and to output a condition ofthe electronic device to a user.

According to an embodiment, the microprocessor selects the one or morereference magnetic field patterns based on the model designation.

According to an embodiment, the user interface receives a selection of acomponent of the electronic device. In one embodiment, the one or morereference magnetic field patterns are selected by the microprocessorbased on the selected component and the model designation.

According to an embodiment, the microprocessor is configured to executecomputer instructions to interrogate and receive signals indicative ofthe magnetic field pattern from the magnetic sensors. Additionally oralternatively, the microprocessor is configured to generate the magneticfield pattern based on indications of magnetic field strengths anddirections from the one or more arrays of magnetic sensors, diagnose thecondition of the electronic device by inferring the condition of theelectronic device by selecting a best fit between the magnetic fieldpattern and the one or more reference magnetic field patterns, andoutput the inferred condition to the user via the user interface.

FIG. 10 is a view of a magnetic sensor array 1000, according to anembodiment. The magnetic sensor array 1000 includes a substrate 1002. Aplurality of magnetic sensors 1004 and a sensor array interface 1006 aredisposed on the substrate 1002. A sensor interface circuit 1008 isdisposed on the substrate 1002 and configured to operatively couple theplurality of magnetic sensors 1004 to the sensor array interface 1006.

According to an embodiment, a first portion 1004 x of the plurality ofmagnetic sensors 1004 can be arranged to detect local magnetic fieldsalong an x-axis parallel to the substrate 1002 and a second portion 1004y of the plurality of magnetic sensors 1004 can be arranged to detectlocal magnetic fields along a y-axis parallel to the substrate 1002perpendicular to the x-axis. Additionally or alternatively, the firstand second portions 1004 x, 1004 y of the plurality of magnetic sensors1004 can be arranged in an alternating array on the substrate 1002.

In another embodiment, the plurality of magnetic sensors 1004 caninclude z-axis sensors aligned to directly detect a z-axis localmagnetic field (aligned normal to the substrate 1002). In someembodiments, it may be useful for all of the plurality of sensors 1004to be z-axis magnetic sensors. In other embodiments, the inventorscontemplate a mixture of x-axis, y-axis, and z-axis sensors to bedisposed on the substrate 1002. The arrays of x-axis, y-axis, and z-axismagnetic sensors can be disposed in a pattern. In some embodiments,z-axis magnetic field data can provide enhanced spatial resolutioncompared to x-axis and y-axis magnetic field data. The sensors 1004 canbe arranged in a XZYZ pattern (to be read clockwise, akin to a Bayerfilter).

The sensor interface circuit 108 can include conductive traces 1010disposed on the substrate 1002. A plurality of mounting pads 1012 can bedisposed on the substrate 1002 and operatively coupled to the conductivetraces 1010 and respective ones of the plurality of magnetic sensors1004. A plurality of bonding pads 1014 can be operatively coupled to theconductive traces 1010 and disposed on the substrate 1002. A wire bond1016 can respectively couple each bonding pad 1014 to a correspondingmagnetic sensor 1004. The conductive traces 1010 can include metaltraces.

FIG. 11 is a partial view of a magnetic sensor array 1100, according toan embodiment. The sensor interface circuit 1008 can include respectiverow and column conductive traces 1010 x, 1010 y disposed on thesubstrate 1002. Respective bonding pads 1014 x, 1014 y can be disposedon the substrate 1002 and operatively coupled to the conductive traces1010 x, 1010 y, optionally through vias 1102. Wire bonds 1016 x, 1016 ycan couple the bonding pads 1014 x, 1014 y to each magnetic sensor 1004.

FIG. 12 is a partial view of a magnetic sensor array 1200, according toanother embodiment. The sensor interface circuit 1008 can includeconductive traces 1010 x, 1010 y disposed on the substrate 1002. Aplurality of pairs of mounting pads 1012 x, 1012 y can be disposed onthe substrate 1002 and operatively coupled to the conductive traces 1010x, 1010 y. Each of the magnetic sensors 1004 can be coupled to arespective pair of mounting pads 1012 x, 1012 y.

In an alternative embodiment, areal density of the magnetic sensors 1004can be increased by the use of buried traces 1010 x, 1010 y. The buriedtraces 1010 x, 1010 y can be coupled to the mounting pads 1012 x, 1012 ythrough vias 1102 formed between selected conductive traces 1010 x, 1010y and the mounting pads 1012 x, 1012 y.

FIG. 13 is a sectional view of a magnetic sensor array 1300, accordingto another embodiment. The substrate 1002 can include two substrates1002 a, 1002 b. The sensor interface circuit 1008 can include two sensorinterface circuits 1008 a, 1008 b respectively disposed on each of thetwo substrates 1002 a, 1002 b. Each of the two sensor interface circuits1008 a, 1008 b can include conductive traces disposed on each respectivesubstrate 1002 a, 1002 b. A plurality of mounting pads 1012 a, 1012 bcan be disposed on the respective substrate 1002 a, 1002 b andoperatively coupled to the conductive traces. Each sensor 1004 caninclude a bottom surface 1302 a operatively coupled to a respective oneof the plurality of mounting pads 1012 a disposed on the first substrate1002 a. Each sensor 1004 can include a top surface 1302 b opposite ofthe bottom surface 1302 a and in contact with a respective one of theplurality of mounting pads 1012 b disposed on the second substrate 1002b.

FIG. 14 is a partial top view of a magnetic sensor array 1400, accordingto an embodiment. FIG. 15 is a perspective view 1500 of a portion of themagnetic sensor array 500 of FIG. 14, according to an embodiment. FIG.16 is a detail view 1600 of the magnetic sensor array 1400 of FIG. 14,according to an embodiment.

Referring to FIGS. 14-16, a first portion 1004 x of the plurality ofmagnetic sensors 1004 can be arranged to detect local magnetic fieldsalong an x-axis parallel to the substrate 1002. A second portion 1004 yof the plurality of magnetic sensors 1004 can be arranged to detectlocal magnetic fields along a y-axis parallel to the substrate 1002perpendicular to the x-axis. A third portion 1004 xz of the plurality ofmagnetic sensors 1004 can be arranged to detect a combination of localmagnetic fields along the x-axis parallel to the substrate 1002 andlocal magnetic fields along a z-axis perpendicular to the substrate1002. A fourth portion 1004 yz of the plurality of magnetic sensors 1004can be arranged to detect a combination of local magnetic fields alongthe y-axis parallel to the substrate 1002 perpendicular to the x-axisand local magnetic fields along a z-axis perpendicular to the substrate1002.

Referring to FIGS. 14-16, the magnetic sensor array 1400, 1500, 1600 canfurther include a magnetic field converter 1402 disposed proximate tothe plurality of sensors 1004. The magnetic field converter 1402 caninclude high magnetic permeability and low coercivity metal configuredto convert at least a portion of a z-axis magnetic field component to aconverted magnetic field component in an x,y plane.

The magnetic field converter 1402 can be formed from mu-metal, a stampedand punched high permeability metal sheet, a stamped metal screen,and/or formed by plating a surface of a dielectric substrate. Themagnetic field converter 1402 can include a curved shape selected toconvey the z-axis magnetic field component into the x,y plane along thehigh reluctance magnetic path defined by the high magnetic permeabilitymaterial.

The converted magnetic field component in the x,y plane can include atleast of a portion of a magnetic field component aligned through atleast a portion of the magnetic sensors 1004. The portion of themagnetic sensors 1004 aligned to the magnetic field component in the x,yplane can include at least one magnetic sensor 1004.

The portion of the magnetic field sensors 1004 aligned to the magneticfield component in the x,y plane can include a portion of the magneticfield sensors 1004 corresponding to a magnetic field return loopdistance. The magnetic field return loop distance can correspond to adisplacement between magnetic poles of a sensed magnetic object. Themagnetic field return loop distance can correspond to a completedmagnetic circuit between opposite magnetic poles comprising amagnetically sensed object. Additionally or alternatively, the magneticfield converter 1402 may include a (concave downward) transmission loopshaped to convey a magnetic field from a (concave upward) portion of themagnetic field converter 1402, through the x,y plane magnetic sensor1004, toward a more distal point, such that the received magnetic fieldis transmitted along a low reluctance path, discontinuous across themagnetic sensor 1004, toward a more distal region but shunted sidewaysbetween opposing tips of the magnetic field converter 1402.

FIG. 17 is a block diagram of a magnetic sensor system 1700, accordingto an embodiment. A magnetic sensor array 1000 can operatively couple toa magnetic pattern analysis circuit 1702 via the sensor interfacecircuit 1008 and the sensor array interface 1006. The magnetic patternanalysis circuit 1702 can be configured to correlate a distance betweensensors 1004 in the array to a physical distance between poles of asensed magnetic object.

Various sensor array sizes are contemplated and/or have been tested bythe inventors. According to embodiments, the plurality of magneticsensors 1004 are disposed in an array of at least two sensors by twosensors. For example, the plurality of magnetic sensors 1004 can includean array of at least eight sensors by eight sensors. In anotherembodiment, more or fewer magnetic sensors 1004 can be combined on asubstrate.

Various types of magnetic field sensors are contemplated and/or havebeen tested by the inventors. In an embodiment, the plurality ofmagnetic sensors 1004 can include a plurality of bare-dies. In anotherembodiment, the plurality of magnetic sensors 1004 can include aplurality of sensors formed directly on the substrate 1002. Variousmagnetic sensing technologies can be used by the magnetic sensors 1004.For example, the magnetic sensors 1004 can include spintronic sensors,inductive sensors, and/or coil-type sensors. Generally, sensors 1004described herein are magnetometers.

For purposes of example, a spintronic sensor can include a first highcoercivity layer magnetically poled along a first axis, a low coercivitylayer disposed on the first high coercivity layer and a second highcoercivity layer magnetically poled along the first axis and disposed onthe low coercivity layer opposite the first high coercivity layer. Thelow coercivity layer is arranged to be magnetically poled by adetectable magnetic field having a second axis different than the firstaxis. The magnetic sensor 1004 can be configured to exhibit a variableresistance through the low coercivity layer as a function of an anglebetween the first and second axes.

The substrate 1002 can be a flexible substrate. A flexible substrate canbe useful, for example, for conforming the magnetic sensors 1004 to acurved surface. The flexible substrate can include polyimide.Additionally or alternatively, the substrate 1002 can include anon-flexible substrate. The non-flexible substrate can include afiberglass-epoxy substrate. For example, a fiberglass-epoxy substratecan be a planar substrate or can be molded to a shape conforming to anobject selected for sensing. In another embodiment, the substrate 1002can include a curved substrate.

In some embodiments, it is desirable to detect magnetic fields producedwithin or adjacent to a curved surface. The substrate 1002 canoptionally be curved to match the curvature of the measured surface. Forexample, a prototype measured surface can be used as a master. A moldrelease compound can be applied to the prototype measured surface.Fiberglass and epoxy can be laid up over the release-treated prototypesurface.

After curing, the curved substrate 1002 is removed from the prototypesurface and trimmed. A sensor interface circuit 1008 (as shown in FIG.10) can be formed by running copper (or other conductor) wires acrossthe back of the curved substrate 1002 (the back side being the sideopposite to the measured surface). Individual sensors 1004 are adheredto the back of the curved substrate 1002, for example using siliconeadhesive. The wires making up the sensor interface circuit 1008 areindividually soldered to the magnetic sensors 1004. Wires can also betacked or fully adhered to the back of the curved substrate 1002 usingsilicone adhesive. A sensor array interface 1006 can be formed from anelectrical junction block that is coupled to each of the wires.

FIG. 18 is a partial view of the magnetic sensor array 1800, accordingto an embodiment. The magnetic sensor array 1800 can include at least aportion 1802 of the plurality of magnetic sensors 1004 arranged todetect local magnetic fields 1804 along a z-axis normal to the substrate1002. Additionally or alternatively, other portions 1802 of theplurality of magnetic sensors 1004 can be arranged to respectivelydetect local magnetic fields along an x-axis parallel to the substrate1002 and along a y-axis parallel to the substrate 1002 and perpendicularto the x-axis. According to an embodiment, substantially all of themagnetic sensors 1004 can be arranged to detect local magnetic fields1804 along a z-axis normal to the substrate 1002.

The magnetic sensor array 1800 can further include a magnetic fieldconverter 1806 disposed proximate to at least some of the portion 1802of the plurality of sensors 1004. The magnetic field converter 1806 caninclude a low coercivity metal configured to convert at least a portionof an x-axis magnetic field component 1808 to a converted magnetic fieldcomponent 1804 along the z-axis. The magnetic field converter 1806 canbe configured to convert the x-axis magnetic field component to a localz-axis magnetic field component 1804 for detection by a portion 1802 ofthe magnetic sensors 1004 arranged to detect local magnetic fields 1804along the z-axis. Additionally or alternatively, the magnetic fieldconverter 1806 can include a low coercivity metal configured to convertat least a portion of a y-axis magnetic field component to a convertedmagnetic field component 1804 along the z-axis.

FIG. 19 is a plan (top) view of a magnetic sensor system 1900 includinga plurality of z-axis magnetic field sensors formed directly on asubstrate 1002, according to an embodiment. The magnetic pattern sensorsystem 1900 can include a sensor substrate 1002. A plurality ofconductive traces 1902, 1904 can be formed directly on the sensorsubstrate 1002. A plurality of magnetic field sensors 1906, 1908, 1910can be formed from the plurality of conductive traces 1902, 1904. Acontrol circuit 1912 can be operatively coupled to the plurality ofconductive traces 1902, 1904.

The plurality of magnetic field sensors 1906, 1908, and 1910 can becoils configured to generate current flow responsive to a local magneticfield component and to modify a current flow applied to each magneticfield sensor as a function of a local magnetic field component. Theplurality of magnetic field sensors 1906, 1908, and 1910 each can beconfigured to detect a magnetic field component oriented normal to thesensor substrate 1002.

In an embodiment, the sensor substrate 1002 can be planar. The magneticfield sensors 1906, 1908, 1910 can be formed by screen printing a thickfilm conductive paste on the sensor substrate 1002. The magnetic fieldsensors 1906, 1908, 1910 can be formed by pad printing a thick filmconductive paste on the sensor substrate 1002. The magnetic fieldsensors 1906, 1908, 1910 can be formed from a printed and curedconductive thick film paste. Additionally or alternatively, the magneticfield sensors 1906, 1908, 1910 can be formed by selectively etching aconductive layer carried by the sensor substrate 1002.

The sensor substrate 1002 can be rigid. In another embodiment, thesensor substrate 1002 can be flexible.

The control circuit 1912 can include a multiplexer 1916 configured toselect and enable a subset of the magnetic field sensors 1906, 1908,1910 for detecting local magnetic field components. An electroniccontroller 1914 can be configured to operate magnetic sensor 1906, 1908,1910 detection logic. A driver and comparator circuit 1918 can beconfigured to detect an electrical signal corresponding to a magneticfield component corresponding to each magnetic sensor 1906, 1908, 1910.The control circuit 1912 can be configured to apply a drive voltage toeach magnetic field sensor 1906, 1908, 1910.

The control circuit 1912 can be configured to detect an electricalresponse of each magnetic field sensor 1906, 1908, 1910 to the drivevoltage. The control circuit 1912 can be configured to correlate theelectrical response of each magnetic field sensor 1906, 1908, 1910 to alocal magnetic field strength proximate to the respective magnetic fieldsensor 1906, 1908, 1910.

The electrical response can include a current flow that is a function ofthe local magnetic field strength. The electrical response can include atime between application of the drive voltage and receipt of a currentflow respectively to and from each magnetic field sensor 1006, 1008,1010. Additionally and/or alternatively, the electrical response caninclude a comparison of voltage between adjacent magnetic field sensors1906, 1908, 1910 that are coiled in opposite directions.

In an embodiment, the drive voltage can be bipolar. The electricalresponse can include a response time for rising and falling edges of adrive waveform that is a function of a local magnetic field component.

According to an embodiment, the control circuit 1912 can be configuredto detect a voltage difference generated by pairs of magnetic fieldsensors 1906 and 1908, and 1906 and 1910 that are coiled in oppositedirections.

In another embodiment, the magnetic field sensors 1906, 1908, 1910 canbe coiled in the same direction (e.g., all right-hand or all left-hand).One or more sensors can be driven by the driver-comparator circuit 1918to output a known magnetic field component. One or more differentsensors can receive an induced current flow responsive to the knownmagnetic field component plus an unknown component. The one or moredriven sensors can then be stopped being driven to output the knownmagnetic field component. The one or more different sensors can receivean induced current flow attributable to only the unknown component.Timing of differences in current flow in the non-driven sensor can beused to determine a value for the unknown magnetic field component.

Additional or alternative sensing modalities can similarly be used bythe control circuit 1912 to determine unknown magnetic field componentsacross the array of magnetic field sensors 1906, 1908, 1910.

FIG. 20 is a flow chart showing a method 2000 for operating a magneticsensor array, according to an embodiment. The method 2000 includes step2002 wherein, for each of a plurality of magnetometers in a magneticsensor array, receiving a magnetic field having a magnetic fieldcomponent along a first axis. In step 2004, the magnetic field componentis guided with a magnetic field converter from the first axis to asecond axis. Proceeding to step 2006, the magnetic field is receivedalong the second axis with the magnetometer.

As shown in step 2008, a signal or data proportional to the receivedmagnetic field strength along the second axis is output from themagnetometer through a sensor interface circuit to a sensor arrayinterface. The method 2000 can further include step 2010, wherein theplurality of data or signals corresponding to the plurality ofmagnetometers is received from the sensor array interface into amagnetic pattern analysis circuit. As shown in step 2012, an image of amagnetic field pattern corresponding to the received magnetic field ateach of a plurality of magnetometer locations in the magnetic sensorarray is generated by the magnetic pattern analysis circuit.

Referring to step 2004, guiding the magnetic field component with themagnetic field converter from the first axis to the second axis caninclude guiding the magnetic field component with a magnetic fieldconverter comprising a low coercivity metal, for example, mu-metal.

In some embodiments, the first and second axes are transverse to oneanother. This can be used to couple three-axis magnetic field strengthpatterns into a magnetometer array formed to sense in only one or twoaxes. This can cause the magnetometers to detect three axis magneticfields and allow the magnetic pattern analysis circuit to generate threeaxis magnetic field images.

In other embodiments, the first and second axes are parallel to oneanother. This can be used to concentrate magnetic field strength acrosseach magnetometer.

FIG. 21 is a flow chart showing a method 2100 for making a magneticsensor array, according to an embodiment. Beginning with step 2102, asubstrate including a sensor interface circuit is provided. In step2104, a plurality of magnetometers are affixed to the substrate atrespective predetermined locations. The plurality of magnetometers canbe unpackaged magnetometers. Proceeding to step 2106, each of themagnetometers is electrically coupled to the sensor interface circuit.In an embodiment, electrically coupling each of the magnetometers to thesensor interface circuit is performed by wire bonding. In anotherembodiment, the magnetometers are electrically coupled to the sensorinterface circuit by surface mount reflow.

In an embodiment, affixing the plurality of magnetometers to thesubstrate in step 2104 and electrically coupling each of themagnetometers to the sensor interface circuit in step 2106 is performedsimultaneously by bonding each magnetometer to at least one bonding padthat is in electrical continuity with a portion of the sensor interfacecircuit.

Proceeding to step 2108, a sensor array interface is coupled to thesensor interface circuit.

Optionally, the method 2100 can include step 2110, wherein a magneticfield converter is affixed to the substrate. The magnetic fieldconverter can include a stamped and punched high permeability metalsheet, such as may be seen in FIGS. 14-16, for example.

FIG. 22 is a block diagram of an electronic device test system 2200,according to an embodiment. The electronic device test system 2200includes a magnetometer array 706 including a plurality of magnetometersaligned to receive an instantaneous magnetic field pattern from anelectronic device 104 in a magnetic field measurement region 2202. Atest circuit 2204 is operatively coupled to the magnetometer array andconfigured to receive signals or data from the magnetometer array 706.The test circuit 2204 is configured to output, to an analysis device2218, magnetic field data corresponding to the received signals or data.The analysis device 2218 includes a computer application configured todiagnose one or more hardware defects in the electronic device 104 as afunction of the magnetic field data.

The electronic device test system 2200 may include a high magneticpermeability wall 2206 configured to exclude external magnetic fieldsfrom an internal cavity 2205 in which the electronic device 104 andmagnetometer array 706 are disposed. The high magnetic permeability wall2206 may be regarded as being a magnetic shield. The high magneticpermeability wall 2206 may be made from mu-metal, for example.

The high magnetic permeability wall 2206 may define an opening forreceiving the electronic device 104. The electronic device test system2200 may include a door or drawer front 2207 configured to close theopening defined by the high magnetic permeability wall 2206 tosubstantially enclose the internal cavity 2205.

The test region 2202 may includes a test platform (e.g., see 704, FIG.7) configured to physically hold the electronic device 104.

The test circuit 2204 may include a microprocessor or microcontroller708, a computer memory 710 operatively coupled to the microprocessor ormicrocontroller 708, and a sensor interface 2208 operatively coupled tothe microprocessor or microcontroller 708 and computer memory 710, thesensor interface 2208 being operatively coupled to the magnetometerarray 706 by a cable routed through a via 2210 in the high magneticpermeability wall 2206.

The test circuit 2204 may further include a device interface 2212configured to provide a logical interface to the electronic device 104.The microprocessor or microcontroller 708, the computer memory 710, andthe device interface 2212 may be configured to cooperate to control theelectronic device 104 to enter one or more states. The one or morestates may each correspond to a nominal magnetic field emission patternemitted by the electronic device 104.

The test circuit 2204 may be configured to output state information andoutput magnetic field data corresponding to one or more instantaneousmagnetic field patterns to the analysis device 2218 via a data interface2216. The analysis device 2218 may be configured to compare one or moreof a sequence of instantaneous magnetic field patterns detected by themagnetometer array 706 to corresponding one or more of a sequence ofnominal magnetic field emission patterns corresponding to the one ormore states. The analysis device 2218 may be configured to outputelectronic device 104 diagnosis information to a user via a graphicaluser interface 2222 displayed on an electronic display 2220, thediagnosis information corresponding to the comparison between the one ormore nominal magnetic field emission pattern and the one or moreinstantaneous (measured) magnetic field emission pattern.

The analysis device 2218 may include an electronic display 2220configured to display a graphical user interface 2222. The graphicaluser interface 2222 may be configured to at least periodically display atesting control object 300 configured to receive user input to controlselection of a state to drive the electronic device 104 to enter.

The electronic device test system 2200 may further include the analysisdevice 2218. The electronic device test system 2200 may further includethe computer application for running on the analysis device 2218. Theanalysis device 2218 may include a computer or a tablet computer.

While various aspects and embodiments have been disclosed herein, otheraspects and embodiments are contemplated. The various aspects andembodiments disclosed herein are for purposes of illustration and arenot intended to be limiting, with the true scope and spirit beingindicated by the following claims.

What is claimed is:
 1. A method, comprising: receiving an electronicdevice on a test platform of an electronic circuit triage system;measuring a magnetic field pattern from the electronic device; comparingthe measured magnetic field pattern to one or more reference magneticfield patterns; determining a condition of the electronic device basedon the comparison of the measured magnetic field pattern to the one ormore reference magnetic field patterns; and outputting an indication ofthe condition to a user.
 2. The method of claim 1, further comprising:receiving, into the electronic circuit triage system, a modeldesignation for the electronic device; and fetching the one or morereference magnetic field patterns in accordance with the modeldesignation.
 3. The method of claim 2, wherein the model designationidentifies a make or model of the electronic device.
 4. The method ofclaim 3, wherein the electronic device is a mobile phone.
 5. The methodof claim 2, wherein the one or more reference magnetic field patternsinclude a plurality of reference magnetic field patterns.
 6. The methodof claim 1, wherein each reference magnetic field pattern corresponds toa nominal condition, a condition requiring repair, a conditioncorresponding to disablement of an electronic device subsystem, acondition requiring battery charging, or a condition indicating batterydegradation.
 7. The method of claim 1, further comprising: capturing oneor more reference images of the electronic device; and determining anorientation and a location of the electronic device relative to the testplatform; wherein comparing the measured magnetic field pattern to theone or more reference magnetic field patterns includes compensating forthe orientation and the location of the electronic device relative tothe test platform.
 8. The method of claim 1, further comprising:transmitting a signal to the electronic device to attempt to cause theelectronic device to enter one or more activated states; whereinmeasuring the magnetic field pattern from the electronic device includesmeasuring the magnetic field pattern while the electronic device is ineach of the one or more activated states.
 9. The method of claim 1,further comprising receiving a selection of a component of theelectronic device for testing, wherein the one or more reference imagescorrespond to the selected component.
 10. The method of claim 9, whereinthe selected component includes one or more of: a battery of theelectronic device; a battery charging circuit of the electronic device;a memory of the electronic device; a display of the electronic device;and a power management system of the electronic device.
 11. The methodof claim 1, wherein the outputting the indication of the condition tothe user includes displaying the indication on the display of theelectronic circuit triage system.
 12. An electronic circuit triagesystem, comprising: a test platform configured to receive an electronicdevice; one or more arrays of magnetic sensors collectively positionedand configured to sense magnetic field characteristics indicative of amagnetic field pattern from the electronic device when the electronicdevice is positioned on the test platform; and a microprocessor coupledto the one or more arrays of magnetic sensors and configured to comparethe magnetic field pattern to one or more reference magnetic fieldpatterns and to diagnose a condition of the electronic device based on acomparison of the magnetic field pattern to the one or more referencemagnetic field patterns.
 13. The electronic circuit triage system ofclaim 12, further comprising a memory configured to store the one ormore reference magnetic field patterns, wherein the microprocessor isconfigured to access the one or more reference magnetic field patternsfrom the memory.
 14. The electronic circuit triage system of claim 13,further comprising a user interface configured to receive a modeldesignation indicating a model of the electronic device and to output acondition of the electronic device to a user.
 15. The electronic circuittriage system of claim 14, wherein the microprocessor selects the one ormore reference magnetic field patterns based on the model designation.16. The electronic circuit triage system of claim 15, wherein the userinterface receives a selection of a component of the electronic device,wherein the one or more reference magnetic field patterns are selectedby the microprocessor based on the selected component and the modeldesignation.
 17. The electronic circuit triage system of claim 14,wherein the microprocessor is configured to execute computerinstructions to interrogate and receive signals indicative of themagnetic field pattern from the magnetic sensors.
 18. The electroniccircuit triage system of claim 17, wherein the microprocessor isconfigured to: generate the magnetic field pattern based on indicationsof magnetic field strengths and directions from the one or more arraysof magnetic sensors, diagnose the condition of the electronic device byinferring the condition of the electronic device by selecting a best fitbetween the magnetic field pattern and the one or more referencemagnetic field patterns; and output the inferred condition to the uservia the user interface.
 19. A method for performing triage on anelectronic device, comprising: receiving into a test system from aninterface a model designator for an electronic device; fetching one ormore reference magnetic field patterns corresponding to the electronicdevice; receiving the electronic device on a test platform; measuring amagnetic field pattern proximate to and relative to the electronicdevice; comparing the measured magnetic field pattern to the one or morereference magnetic field patterns; inferring a condition of theelectronic device as a function of a correspondence of the measuredmagnetic field pattern to the one or more reference magnetic fieldpatterns; and outputting the inferred condition to a user.
 20. Themethod of claim 19, wherein the one or more reference magnetic fieldpatterns comprises a plurality of reference magnetic field patterns. 21.The method of claim 19, wherein each reference magnetic field patterncorresponds to a nominal condition, a condition requiring repair, acondition corresponding to disablement of an electronic devicesubsystem, a condition requiring battery charging, or a conditionindicating battery degradation.
 22. The method of claim 19, furthercomprising: capturing an image of the electronic device; and determiningan orientation and location of the electronic device relative to thetest platform; wherein comparing the measured magnetic field pattern tothe one or more reference magnetic field patterns includes compensatingfor the orientation and location of the electronic device relative tothe test platform.
 23. The method of claim 19, further comprising:transmitting a signal to the electronic device to attempt to cause theelectronic device to enter one or more activated states; whereinmeasuring the magnetic field pattern proximate to and relative to theelectronic device includes measuring the magnetic field pattern whilethe electronic device is in each of the one or more activated states.